IEEE 1149 family of standards

E53490

JTAG boundary-scan standard family of technical standards

The IEEE 1149 family of standards is a set of Joint Test Action Group (JTAG) boundary-scan specifications that define methods for testing, debugging, and accessing digital integrated circuits and boards.

Aliases (4)

IEEE 1149.1 ×6
JTAG ×2
IEEE 1149 boundary-scan standards family ×1
IEEE 1149 family of test standards ×1

Statements (48)

Predicate	Object
instanceOf	JTAG boundary-scan standard → family of technical standards →
acronym	JTAG →
appliesTo	digital integrated circuits → printed circuit board assemblies →
basedOn	boundary-scan architecture →
communicationStyle	serial scan chain →
coreStandard	IEEE 1149.1 →
defines	methods for accessing on-chip test features → methods for debugging digital systems → methods for testing digital integrated circuits → methods for testing printed circuit boards →
developedBy	Institute of Electrical and Electronics Engineers →
domain	electronic design and test →
enables	remote debugging of embedded systems → test access through a small number of pins → test of devices without physical probe access →
includes	IEEE 1149.1 → IEEE 1149.10 → IEEE 1149.10 gigabit test bus standard → IEEE 1149.4 → IEEE 1149.4 mixed-signal test bus standard → IEEE 1149.6 → IEEE 1149.6 AC-coupled interconnect test standard → IEEE 1149.7 → IEEE 1149.7 compact JTAG standard → IEEE 1149.8.1 → IEEE 1149.8.1 power-down test standard →
originatedFrom	Joint Test Action Group →
primaryApplication	in-system programming of devices → manufacturing test of digital boards → on-chip debug access →
relatedTo	IEEE 1500 embedded core test standard → IEEE 1532 in-system configuration standard → boundary-scan description language →
standardizedBy	IEEE Standards Association →
supports	board-level interconnect testing → device-level structural testing → non-intrusive access to device pins → test automation in production →
typicalSignals	TCK → TDI → TDO → TMS →
usesConcept	boundary-scan register → instruction register → test access port → test data registers →

Referenced by (11)

Subject (surface form when different)	Predicate
IEEE 1149.10 ("IEEE 1149.1") → IEEE 1149.10 ("JTAG") → IEEE 1149.7 ("IEEE 1149.1") →	relatedTo
IEEE 1149.4 ("IEEE 1149.1") → IEEE 1149.7 ("IEEE 1149.1") →	extends
IEEE 1149.7 ("JTAG") →	basedOn
IEEE 1149 family of standards ("IEEE 1149.1") →	coreStandard
IEEE 1149 family of standards ("IEEE 1149.1") →	includes
IEEE 1149.6 →	isPartOf
IEEE 1149.4 ("IEEE 1149 family of test standards") →	partOf
IEEE 1149.10 ("IEEE 1149 boundary-scan standards family") →	partOfSeries