IEEE 1149.4

E55111

IEEE standard boundary-scan standard mixed-signal test bus standard

IEEE 1149.4 is a mixed-signal test bus standard that extends JTAG boundary-scan techniques to support testing and diagnosis of analog and mixed-signal circuits on printed circuit boards.

Aliases (1)

IEEE 1149.4 mixed-signal test bus standard ×1

Statements (42)

Predicate	Object
instanceOf	IEEE standard → boundary-scan standard → mixed-signal test bus standard →
appliesTo	printed circuit boards →
benefits	fault isolation in analog sections of PCBs → non-intrusive analog measurements on boards →
compatibleWith	IEEE 1149.1 boundary-scan chains →
defines	analog boundary modules → analog test access port → analog test bus → test bus interface circuits →
domain	design for testability → electronic test → mixed-signal integrated circuits →
enables	board-level analog test access → in-system test of analog nodes → measurement of analog signals via digital test infrastructure →
extends	IEEE 1149.1 →
focusesOn	on-board analog signal routing for test → standardized analog test access structures →
goal	improve testability of analog and mixed-signal boards → reduce need for physical test access to analog nodes →
hasAbbreviation	1149.4 →
hasFeature	analog boundary-scan cells → programmable connection of pins to analog test bus → two-wire analog test bus →
hasType	mixed-signal extension of JTAG →
partOf	IEEE 1149 family of test standards →
relatedTo	JTAG → boundary-scan architecture →
requires	dedicated analog test pins on compliant devices →
standardizedBy	IEEE → Institute of Electrical and Electronics Engineers →
supports	diagnosis of analog circuits → diagnosis of mixed-signal circuits → testing of analog circuits → testing of mixed-signal circuits →
usedBy	automatic test equipment → board test systems →
usedIn	diagnostic test of fielded systems → production test of electronic assemblies →
usesTechnique	boundary-scan →

Referenced by (4)

Subject (surface form when different)	Predicate
IEEE 1149 family of standards → IEEE 1149 family of standards ("IEEE 1149.4 mixed-signal test bus standard") →	includes
IEEE 1149.6 → IEEE 1149.7 →	relatedTo