IEEE 1149.1 JTAG boundary‑scan standard
E1466
The IEEE 1149.1 JTAG boundary-scan standard is a widely used test and debug specification that defines a serial interface and architecture for accessing and testing the internal logic and interconnects of integrated circuits and circuit boards.
All labels observed (19)
How this entity was disambiguated
This entity first appeared as the object of triple T12939 — resolving that mention is where its identity was fixed. The disambiguator weighed these candidate entities and picked the highlighted one (or “None”, minting a new entity). This is how homonymy is resolved: the same surface form can point to different entities.
NED1
Entity disambiguation (via context triple)
gpt-5-mini-2025-08-07
Target entity: IEEE 1149.1 JTAG boundary‑scan standard Context triple: [IEEE Standards Association, develops, IEEE 1149.1 JTAG boundary‑scan standard]
-
A.
IRE Transactions on Circuit Theory
IRE Transactions on Circuit Theory was a peer-reviewed scientific journal published by the Institute of Radio Engineers that focused on theoretical and analytical aspects of electrical and electronic circuits.
-
B.
IRE Transactions on Electron Devices
IRE Transactions on Electron Devices was a peer-reviewed scientific journal published by the Institute of Radio Engineers that focused on research in electron and semiconductor devices, later continuing as part of the IEEE Transactions series.
-
C.
IEEE Electron Devices Society
The IEEE Electron Devices Society is a professional society within IEEE that focuses on the theory, design, fabrication, and application of electron and semiconductor devices.
-
D.
IEEE 1394
IEEE 1394 is a high-speed serial bus interface standard, commonly known as FireWire, used for real-time data transfer between digital devices such as computers, cameras, and audio/video equipment.
-
E.
IRE Transactions on Space Electronics and Telemetry
IRE Transactions on Space Electronics and Telemetry was a specialized scientific journal published by the Institute of Radio Engineers focusing on research in space electronics, telemetry, and related communication technologies.
- F. None of above. chosen
- G. Unsure - the case is ambiguous/there is not enough information to decide.
NED2
Entity disambiguation (via description)
gpt-5-mini-2025-08-07
Target entity: IEEE 1149.1 JTAG boundary‑scan standard Target entity description: The IEEE 1149.1 JTAG boundary-scan standard is a widely used test and debug specification that defines a serial interface and architecture for accessing and testing the internal logic and interconnects of integrated circuits and circuit boards.
-
A.
IRE Transactions on Circuit Theory
IRE Transactions on Circuit Theory was a peer-reviewed scientific journal published by the Institute of Radio Engineers that focused on theoretical and analytical aspects of electrical and electronic circuits.
-
B.
IRE Transactions on Electron Devices
IRE Transactions on Electron Devices was a peer-reviewed scientific journal published by the Institute of Radio Engineers that focused on research in electron and semiconductor devices, later continuing as part of the IEEE Transactions series.
-
C.
IEEE Electron Devices Society
The IEEE Electron Devices Society is a professional society within IEEE that focuses on the theory, design, fabrication, and application of electron and semiconductor devices.
-
D.
IEEE 1394
IEEE 1394 is a high-speed serial bus interface standard, commonly known as FireWire, used for real-time data transfer between digital devices such as computers, cameras, and audio/video equipment.
-
E.
IRE Transactions on Space Electronics and Telemetry
IRE Transactions on Space Electronics and Telemetry was a specialized scientific journal published by the Institute of Radio Engineers focusing on research in space electronics, telemetry, and related communication technologies.
- F. None of above. chosen
Statements (54)
| Predicate | Object |
|---|---|
| instanceOf |
IEEE standard
ⓘ
boundary-scan standard ⓘ electronic test standard ⓘ |
| alsoKnownAs |
IEEE 1149.1 JTAG boundary‑scan standard
ⓘ
surface form:
IEEE 1149.1
IEEE 1149.1 JTAG boundary‑scan standard ⓘ
surface form:
JTAG
IEEE 1149.1 JTAG boundary‑scan standard ⓘ
surface form:
JTAG boundary-scan
|
| appliesTo |
digital integrated circuits
ⓘ
printed circuit boards ⓘ |
| architectureType | serial scan chain ⓘ |
| category | design for testability ⓘ |
| defines |
IDCODE register
ⓘ
TAP controller ⓘ Test Access Port ⓘ boundary-scan architecture ⓘ boundary-scan register ⓘ bypass register ⓘ instruction register ⓘ serial test access port interface ⓘ test data registers ⓘ |
| definesOptionalSignal | TRST ⓘ |
| definesSignal |
TCK
ⓘ
TDI ⓘ TDO ⓘ TMS ⓘ |
| field |
digital integrated circuits
ⓘ
electronic design automation ⓘ printed circuit board testing ⓘ |
| fullName |
IEEE 1149.1 JTAG boundary‑scan standard
self-linksurface differs
ⓘ
surface form:
IEEE Standard Test Access Port and Boundary-Scan Architecture
|
| hasFeature |
boundary-scan cells on digital I/O pins
ⓘ
chaining of multiple devices in a scan path ⓘ control of output pins via scan chain ⓘ non-intrusive observation of pin states ⓘ |
| introducedConcept |
boundary-scan cell
ⓘ
test access port ⓘ |
| publishedBy |
IEEE Standards Association
ⓘ
Institute of Electrical and Electronics Engineers ⓘ |
| purpose |
board-level interconnect testing
ⓘ
debug access to internal logic ⓘ in-system programming of devices ⓘ in-system test of integrated circuits ⓘ |
| relatedStandard |
IEEE 1149.6
ⓘ
surface form:
IEEE 1149.4
IEEE 1149.6 ⓘ IEEE 1149.7 ⓘ IEEE 1532 ⓘ |
| specifies | finite state machine for TAP controller ⓘ |
| status | widely adopted in semiconductor industry ⓘ |
| supports |
BYPASS instruction
ⓘ
IEEE 1149.1 JTAG boundary‑scan standard self-linksurface differs ⓘ
surface form:
EXTEST instruction
IDCODE instruction ⓘ PRELOAD instruction ⓘ SAMPLE instruction ⓘ |
| usedFor |
field diagnostics
ⓘ
hardware debug ⓘ manufacturing test ⓘ |
How these facts were elicited
The pipeline generated the facts above by prompting gpt-5.1 with this entity's name + description and the instruction below.
Instruction
You are a knowledge base construction expert. Given a subject entity and a description of it, return factual statements that you know for the subject as a JSON list of dictionaries(triples), where keys must be "subject", "predicate" and "object". The number of facts may be very high, between 25 to 50 or more, for very popular subjects. For less popular subjects, the number of facts can be very low, like 5 or 10. # Requirements - If you don't know the subject at all, return an empty list. - If the subject is not a named entity, return an empty list. - Include at least one triple where predicate is "instanceOf". - Do not get too wordy. - Separate several objects into multiple triples with one object.
Input
Subject: IEEE 1149.1 JTAG boundary‑scan standard Description of subject: The IEEE 1149.1 JTAG boundary-scan standard is a widely used test and debug specification that defines a serial interface and architecture for accessing and testing the internal logic and interconnects of integrated circuits and circuit boards.
Referenced by (35)
Full triples — surface form annotated when it differs from this entity's canonical label.
subject surface form:
IEEE 1149.1 JTAG boundary-scan standard
this entity surface form:
IEEE 1149.1
subject surface form:
IEEE 1149.1 JTAG boundary-scan standard
this entity surface form:
JTAG
subject surface form:
IEEE 1149.1 JTAG boundary-scan standard
this entity surface form:
JTAG boundary-scan
IEEE 1149.1 JTAG boundary‑scan standard
→
fullName
→
IEEE 1149.1 JTAG boundary‑scan standard
self-linksurface differs
ⓘ
subject surface form:
IEEE 1149.1 JTAG boundary-scan standard
this entity surface form:
IEEE Standard Test Access Port and Boundary-Scan Architecture
IEEE 1149.1 JTAG boundary‑scan standard
→
supports
→
IEEE 1149.1 JTAG boundary‑scan standard
self-linksurface differs
ⓘ
subject surface form:
IEEE 1149.1 JTAG boundary-scan standard
this entity surface form:
EXTEST instruction
this entity surface form:
IEEE 1149.1
this entity surface form:
JTAG
this entity surface form:
IEEE 1149.1 JTAG specification
this entity surface form:
IEEE 1149.1
this entity surface form:
TAP (Test Access Port)
this entity surface form:
IEEE 1149.1 JTAG specification
this entity surface form:
IEEE 1149.1 boundary-scan
this entity surface form:
IEEE 1149.1
this entity surface form:
IEEE 1149.1 Test Access Port
this entity surface form:
IEEE 1149.1
this entity surface form:
IEEE 1149.1
this entity surface form:
IEEE 1149.1 test access port (TAP)
this entity surface form:
IEEE 1149.1 test access port
this entity surface form:
JTAG
this entity surface form:
boundary-scan register
this entity surface form:
JTAG
this entity surface form:
IEEE 1149.1 boundary-scan chains
this entity surface form:
IEEE 1149.1 boundary-scan architecture
this entity surface form:
JTAG
this entity surface form:
JTAG
this entity surface form:
IEEE 1149.1 boundary-scan standard
this entity surface form:
JTAG
this entity surface form:
JTAG boundary-scan architecture
this entity surface form:
IEEE 1149.1 boundary-scan standard
this entity surface form:
JTAG interface
this entity surface form:
JTAG boundary-scan group
IEEE Standard for High-Speed Test Access Port and Boundary-Scan Architecture
→
relatedTo
→
IEEE 1149.1 JTAG boundary‑scan standard
ⓘ
subject surface form:
IEEE 1149.10
this entity surface form:
JTAG