Triple
T73265
| Position | Surface form | Disambiguated ID | Type / Status |
|---|---|---|---|
| Subject | IEEE 1149.1 JTAG boundary-scan standard |
E1466
|
entity |
| Predicate | relatedStandard |
P37
|
FINISHED |
| Object |
IEEE 1149.7
IEEE 1149.7 is a compact, enhanced version of the JTAG test and debug standard that reduces pin count and power while adding advanced debug and trace capabilities for modern integrated circuits.
|
E10411
|
NE FINISHED |
Provenance (5 batches)
| Stage | Batch ID | Job type | Status |
|---|---|---|---|
| creating | batch_69a24c06b3bc8190aa4ac89026115efc |
elicitation | completed |
| NER | batch_69a2567b592c8190aaf692a18fcd2f1b |
ner | completed |
| NED1 | batch_69a275e2a91c81908ec21814794d70a6 |
ned_source_triple | completed |
| NED2 | batch_69a277437a1c819086ce4faf0e913a1d |
ned_description | completed |
| NEDg | batch_69a276c04f308190b3089549a8bc7cec |
nedg | completed |
Created at: Feb. 28, 2026, 2:03 a.m.