TDI
E6442
TDI (Test Data In) is the serial input pin used in JTAG boundary-scan to feed test instructions and data into a device’s test access port.
Statements (33)
| Predicate | Object |
|---|---|
| instanceOf |
JTAG signal
→
test access port pin → |
| abbreviationOf |
Test Data In
→
|
| chainPosition |
first JTAG input of a device in a scan chain
→
|
| clockedBy |
TCK
→
|
| connectedTo |
TDO of previous device in JTAG chain
→
|
| dataDirection |
input
→
|
| dataPath |
feeds serial scan path inside device
→
|
| definedIn |
IEEE 1149.1 standard
→
|
| directionRelativeToDevice |
from external JTAG controller into device
→
|
| electricalType |
digital input pin
→
|
| fullName |
Test Data In
→
|
| function |
serial input of test data
→
serial input of test instructions → |
| logicalLevel |
binary
→
|
| partOf |
JTAG test access port interface
→
|
| relatedSignal |
TCK
→
TDO → TMS → TRST → |
| requires |
proper termination in multi-device chains
→
|
| requiresComplianceWith |
JTAG timing specifications
→
|
| roleInTAP |
input pin to the test access port
→
|
| sampledOn |
TCK rising edge
→
|
| signalType |
serial
→
|
| usedDuring |
boundary-scan testing
→
debug operations via JTAG → in-system programming → |
| usedFor |
shifting data into data registers
→
shifting data into instruction register → |
| usedIn |
IEEE 1149.1 boundary-scan
→
JTAG → |
| voltageDomain |
device I/O supply domain
→
|
Referenced by (2)
| Subject (surface form when different) | Predicate |
|---|---|
|
IEEE 1149.1 JTAG boundary-scan standard
→
|
definesSignal |
|
TMS
→
|
worksWith |