Triple
T2424381
| Position | Surface form | Disambiguated ID | Type / Status |
|---|---|---|---|
| Subject | IEEE 1149 family of standards |
E53490
|
entity |
| Predicate | originatedFrom |
P409
|
FINISHED |
| Object |
Joint Test Action Group
The Joint Test Action Group (JTAG) is an industry consortium that developed the boundary-scan test methodology for integrated circuits, which became standardized as the IEEE 1149.x family of standards.
|
E265711
|
NE FINISHED |
Provenance (5 batches)
| Stage | Batch ID | Job type | Status |
|---|---|---|---|
| creating | batch_69ab495c44d48190b7235b23719bc3f6 |
elicitation | completed |
| NER | batch_69abc973aee08190b543492f436f3fe5 |
ner | completed |
| NED1 | batch_69aebf5e33208190a6899e6672b3daeb |
ned_source_triple | completed |
| NED2 | batch_69aec6194a3c81909055a16553f39e78 |
ned_description | completed |
| NEDg | batch_69aec590516c81908f5126e203bb3638 |
nedg | completed |
Created at: March 6, 2026, 9:42 p.m.