Triple
T415915
| Position | Surface form | Disambiguated ID | Type / Status |
|---|---|---|---|
| Subject | IEEE 1149.6 |
E9591
|
entity |
| Predicate | relatedTo |
P37
|
FINISHED |
| Object |
IEEE 1149.10
IEEE 1149.10 is a JTAG-related IEEE standard that defines high-speed test access mechanisms for embedded instrumentation and system-level testing of complex digital devices and boards.
|
E56156
|
NE FINISHED |
Provenance (5 batches)
| Stage | Batch ID | Job type | Status |
|---|---|---|---|
| creating | batch_69a2e80111fc8190961d5b7c6154123f |
elicitation | completed |
| NER | batch_69a2ee8d835881908403ea23901e52b3 |
ner | completed |
| NED1 | batch_69a4429ec70c8190aaff2e0e6af82612 |
ned_source_triple | completed |
| NED2 | batch_69a4438d88f08190b0b9e7667c756710 |
ned_description | completed |
| NEDg | batch_69a4433304ec8190a60f945e7a506d75 |
nedg | completed |
Created at: Feb. 28, 2026, 1:09 p.m.