Triple
T2530968
| Position | Surface form | Disambiguated ID | Type / Status |
|---|---|---|---|
| Subject | IEEE 1149.10 |
E56156
|
entity |
| Predicate | fullName |
P16
|
FINISHED |
| Object |
IEEE Standard for High-Speed Test Access Port and Boundary-Scan Architecture
IEEE 1149.10 is a JTAG-related IEEE standard that defines a high-speed test access and boundary-scan architecture for efficient testing and debugging of complex digital integrated circuits and systems.
|
E280701
|
NE FINISHED |
Provenance (5 batches)
| Stage | Batch ID | Job type | Status |
|---|---|---|---|
| creating | batch_69ab4a48e4f081908f1218d244608659 |
elicitation | completed |
| NER | batch_69abd2781700819091ffc32244d9efe2 |
ner | completed |
| NED1 | batch_69af83921d3481909f7bf43b3300056c |
ned_source_triple | completed |
| NED2 | batch_69af8487bcac819085b6f5827a48696a |
ned_description | completed |
| NEDg | batch_69af8421dae081909fd8c7ac37cd96f3 |
nedg | completed |
Created at: March 6, 2026, 9:46 p.m.