Triple
T9627568
| Position | Surface form | Disambiguated ID | Type / Status |
|---|---|---|---|
| Subject | Moore 1965 paper |
E232506
|
entity |
| Predicate | relatedTo |
P37
|
FINISHED |
| Object | International Technology Roadmap for Semiconductors |
E232503
|
NE FINISHED |
How this triple was built (2 steps)
Every LLM step that produced this triple, in pipeline order — named-entity classification, the disambiguation choices (the exact options shown, with the pick highlighted), and the generated description. The batch + timestamp of each is in the Provenance table below.
NER
Named-entity recognition
gpt-5-mini
Instruction
Given a phrase, classify it is english named entity (e.g., persons, organizations, works of art) in Latin script, or not (e.g., literals, dates, URLs, verbose phrases). For disambiguation, the statement where the phrase occurs as object is also given. Please return a JSON object with `phrase` (string, the phrase being analyzed) and `is_ne` (boolean, indicating whether the phrase is a Named Entity).
Input
Phrase: International Technology Roadmap for Semiconductors | Statement: [Moore 1965 paper, relatedTo, International Technology Roadmap for Semiconductors]
NED1
Entity disambiguation (via context triple)
gpt-5-mini-2025-08-07
Target entity: International Technology Roadmap for Semiconductors Context triple: [Moore 1965 paper, relatedTo, International Technology Roadmap for Semiconductors]
-
A.
International Technology Roadmap for Semiconductors
chosen
The International Technology Roadmap for Semiconductors was a collaborative industry effort that forecasted and coordinated global semiconductor technology development, guiding research and manufacturing priorities for chip scaling and performance.
-
B.
IEEE International Electron Devices Meeting
The IEEE International Electron Devices Meeting is a premier annual conference where researchers and industry leaders present and discuss cutting-edge advances in semiconductor and electronic device technology.
-
C.
Mead–Conway VLSI design revolution
The Mead–Conway VLSI design revolution was a transformative shift in microchip design methodology that introduced simplified, scalable design rules and modular, high-level approaches, enabling widespread, university-level integrated circuit design and catalyzing the modern semiconductor industry.
-
D.
IEEE 1500 embedded core test standard
The IEEE 1500 embedded core test standard defines a structured test access and wrapper architecture for testing individual IP cores within system-on-chip (SoC) designs.
-
E.
Advanced Semiconductor Materials International
Advanced Semiconductor Materials International is the Dutch technology company that evolved into ASML, a leading global manufacturer of photolithography systems for the semiconductor industry.
- F. None of above.
- G. Unsure - the case is ambiguous/there is not enough information to decide.
Provenance (3 batches)
The batch behind each pipeline step, in order, with when it ran. Timestamps are batch-level — stages were processed in waves, so the object chain (NER → NED1 → NEDg → NED2) reads in order, but predicate / elicitation batches can sit in a different wave.
| Step | Stage | Batch ID | Status | When |
|---|---|---|---|---|
| creating | Elicitation | batch_69ca848793ec8190a93a12383a754dc0 |
completed | March 30, 2026, 2:11 p.m. |
| NER | Named-entity recognition | batch_69cd9afeb64c8190be91024c2e9039d3 |
completed | April 1, 2026, 10:23 p.m. |
| NED1 | Entity disambiguation (via context triple) | batch_69d1798129dc819090a29efcbcf34b8e |
completed | April 4, 2026, 8:50 p.m. |
Created at: March 30, 2026, 8:10 p.m.