Triple

T11226587
Position Surface form Disambiguated ID Type / Status
Subject IEEE 1500 embedded core test standard E265710 entity
Predicate relatedTo P37 FINISHED
Object IEEE 1687 embedded instrumentation standard
IEEE 1687 embedded instrumentation standard is a test access architecture standard that defines a scalable, reconfigurable method for accessing on-chip instruments and debug features through a JTAG-based interface.
E912829 NE FINISHED

How this triple was built (4 steps)

Every LLM step that produced this triple, in pipeline order — named-entity classification, the disambiguation choices (the exact options shown, with the pick highlighted), and the generated description. The batch + timestamp of each is in the Provenance table below.

NER Named-entity recognition gpt-5-mini
Instruction
Given a phrase, classify it is english named entity (e.g., persons, organizations, works of art) in Latin script, or not (e.g., literals, dates, URLs, verbose phrases). For disambiguation, the statement where the phrase occurs as object is also given. Please return a JSON object with `phrase` (string, the phrase being analyzed) and `is_ne` (boolean, indicating whether the phrase is a Named Entity).
Input
Phrase: IEEE 1687 embedded instrumentation standard | Statement: [IEEE 1500 embedded core test standard, relatedTo, IEEE 1687 embedded instrumentation standard]
NED1 Entity disambiguation (via context triple) gpt-5-mini-2025-08-07
Target entity: IEEE 1687 embedded instrumentation standard
Context triple: [IEEE 1500 embedded core test standard, relatedTo, IEEE 1687 embedded instrumentation standard]
  • A. IEEE 1500 embedded core test standard
    The IEEE 1500 embedded core test standard defines a structured test access and wrapper architecture for testing individual IP cores within system-on-chip (SoC) designs.
  • B. IEEE 1532
    IEEE 1532 is an extension of the JTAG boundary-scan standard that defines in-system programming and configuration procedures for programmable devices such as FPGAs and CPLDs.
  • C. IEEE 1149 family of standards
    The IEEE 1149 family of standards is a set of Joint Test Action Group (JTAG) boundary-scan specifications that define methods for testing, debugging, and accessing digital integrated circuits and boards.
  • D. IEEE 1496-1993
    IEEE 1496-1993 is an IEEE standard that specifies the SBus computer bus architecture used primarily in Sun Microsystems workstations and servers.
  • E. IEEE Std 610.12-2010
    IEEE Std 610.12-2010 is an updated IEEE standard that provides a formal glossary of terms and definitions used in software engineering.
  • F. None of above. chosen
  • G. Unsure - the case is ambiguous/there is not enough information to decide.
NEDg Description generation gpt-5.1
Instruction
Generate a one-sentence description of the target entity. 
You are given a context triple in the form (subject, predicate, object), where the object is the target entity. 
# Instructions
Use the triple to infer relevant information about the entity. Describe the entity based on what is most defining, well-known. 
Avoid repeating the information from the triple, unless really essential.
# Response Format
Return only the sentence: "Description: [one-sentence description of the target entity]"
Input
Entity: IEEE 1687 embedded instrumentation standard
Triple: [IEEE 1500 embedded core test standard, relatedTo, IEEE 1687 embedded instrumentation standard]
Generated description
IEEE 1687 embedded instrumentation standard is a test access architecture standard that defines a scalable, reconfigurable method for accessing on-chip instruments and debug features through a JTAG-based interface.
NED2 Entity disambiguation (via description) gpt-5-mini-2025-08-07
Target entity: IEEE 1687 embedded instrumentation standard
Target entity description: IEEE 1687 embedded instrumentation standard is a test access architecture standard that defines a scalable, reconfigurable method for accessing on-chip instruments and debug features through a JTAG-based interface.
  • A. IEEE 1500 embedded core test standard
    The IEEE 1500 embedded core test standard defines a structured test access and wrapper architecture for testing individual IP cores within system-on-chip (SoC) designs.
  • B. IEEE 1532
    IEEE 1532 is an extension of the JTAG boundary-scan standard that defines in-system programming and configuration procedures for programmable devices such as FPGAs and CPLDs.
  • C. IEEE 1149 family of standards
    The IEEE 1149 family of standards is a set of Joint Test Action Group (JTAG) boundary-scan specifications that define methods for testing, debugging, and accessing digital integrated circuits and boards.
  • D. IEEE 1496-1993
    IEEE 1496-1993 is an IEEE standard that specifies the SBus computer bus architecture used primarily in Sun Microsystems workstations and servers.
  • E. IEEE Std 610.12-2010
    IEEE Std 610.12-2010 is an updated IEEE standard that provides a formal glossary of terms and definitions used in software engineering.
  • F. None of above. chosen

Provenance (5 batches)

The batch behind each pipeline step, in order, with when it ran. Timestamps are batch-level — stages were processed in waves, so the object chain (NER → NED1 → NEDg → NED2) reads in order, but predicate / elicitation batches can sit in a different wave.

Step Stage Batch ID Status When
creating Elicitation batch_69d6aac656d48190b275efaa7d6074ee completed April 8, 2026, 7:21 p.m.
NER Named-entity recognition batch_69d7e8ff7b40819089c835be710bc575 completed April 9, 2026, 5:59 p.m.
NED1 Entity disambiguation (via context triple) batch_69e4ad33fdf48190a7118c7c30577ec9 completed April 19, 2026, 10:23 a.m.
NEDg Description generation batch_69e4b1ee74748190a33449ce1b92813e completed April 19, 2026, 10:43 a.m.
NED2 Entity disambiguation (via description) batch_69e4b3d23b18819096f3a11aecc732bd completed April 19, 2026, 10:52 a.m.
Created at: April 8, 2026, 9:30 p.m.