Triple
T11226587
| Position | Surface form | Disambiguated ID | Type / Status |
|---|---|---|---|
| Subject | IEEE 1500 embedded core test standard |
E265710
|
entity |
| Predicate | relatedTo |
P37
|
FINISHED |
| Object |
IEEE 1687 embedded instrumentation standard
IEEE 1687 embedded instrumentation standard is a test access architecture standard that defines a scalable, reconfigurable method for accessing on-chip instruments and debug features through a JTAG-based interface.
|
E912829
|
NE FINISHED |
How this triple was built (4 steps)
Every LLM step that produced this triple, in pipeline order — named-entity classification, the disambiguation choices (the exact options shown, with the pick highlighted), and the generated description. The batch + timestamp of each is in the Provenance table below.
NER
Named-entity recognition
gpt-5-mini
Instruction
Given a phrase, classify it is english named entity (e.g., persons, organizations, works of art) in Latin script, or not (e.g., literals, dates, URLs, verbose phrases). For disambiguation, the statement where the phrase occurs as object is also given. Please return a JSON object with `phrase` (string, the phrase being analyzed) and `is_ne` (boolean, indicating whether the phrase is a Named Entity).
Input
Phrase: IEEE 1687 embedded instrumentation standard | Statement: [IEEE 1500 embedded core test standard, relatedTo, IEEE 1687 embedded instrumentation standard]
NED1
Entity disambiguation (via context triple)
gpt-5-mini-2025-08-07
Target entity: IEEE 1687 embedded instrumentation standard Context triple: [IEEE 1500 embedded core test standard, relatedTo, IEEE 1687 embedded instrumentation standard]
-
A.
IEEE 1500 embedded core test standard
The IEEE 1500 embedded core test standard defines a structured test access and wrapper architecture for testing individual IP cores within system-on-chip (SoC) designs.
-
B.
IEEE 1532
IEEE 1532 is an extension of the JTAG boundary-scan standard that defines in-system programming and configuration procedures for programmable devices such as FPGAs and CPLDs.
-
C.
IEEE 1149 family of standards
The IEEE 1149 family of standards is a set of Joint Test Action Group (JTAG) boundary-scan specifications that define methods for testing, debugging, and accessing digital integrated circuits and boards.
-
D.
IEEE 1496-1993
IEEE 1496-1993 is an IEEE standard that specifies the SBus computer bus architecture used primarily in Sun Microsystems workstations and servers.
-
E.
IEEE Std 610.12-2010
IEEE Std 610.12-2010 is an updated IEEE standard that provides a formal glossary of terms and definitions used in software engineering.
- F. None of above. chosen
- G. Unsure - the case is ambiguous/there is not enough information to decide.
NEDg
Description generation
gpt-5.1
Instruction
Generate a one-sentence description of the target entity. You are given a context triple in the form (subject, predicate, object), where the object is the target entity. # Instructions Use the triple to infer relevant information about the entity. Describe the entity based on what is most defining, well-known. Avoid repeating the information from the triple, unless really essential. # Response Format Return only the sentence: "Description: [one-sentence description of the target entity]"
Input
Entity: IEEE 1687 embedded instrumentation standard Triple: [IEEE 1500 embedded core test standard, relatedTo, IEEE 1687 embedded instrumentation standard]
Generated description
IEEE 1687 embedded instrumentation standard is a test access architecture standard that defines a scalable, reconfigurable method for accessing on-chip instruments and debug features through a JTAG-based interface.
NED2
Entity disambiguation (via description)
gpt-5-mini-2025-08-07
Target entity: IEEE 1687 embedded instrumentation standard Target entity description: IEEE 1687 embedded instrumentation standard is a test access architecture standard that defines a scalable, reconfigurable method for accessing on-chip instruments and debug features through a JTAG-based interface.
-
A.
IEEE 1500 embedded core test standard
The IEEE 1500 embedded core test standard defines a structured test access and wrapper architecture for testing individual IP cores within system-on-chip (SoC) designs.
-
B.
IEEE 1532
IEEE 1532 is an extension of the JTAG boundary-scan standard that defines in-system programming and configuration procedures for programmable devices such as FPGAs and CPLDs.
-
C.
IEEE 1149 family of standards
The IEEE 1149 family of standards is a set of Joint Test Action Group (JTAG) boundary-scan specifications that define methods for testing, debugging, and accessing digital integrated circuits and boards.
-
D.
IEEE 1496-1993
IEEE 1496-1993 is an IEEE standard that specifies the SBus computer bus architecture used primarily in Sun Microsystems workstations and servers.
-
E.
IEEE Std 610.12-2010
IEEE Std 610.12-2010 is an updated IEEE standard that provides a formal glossary of terms and definitions used in software engineering.
- F. None of above. chosen
Provenance (5 batches)
The batch behind each pipeline step, in order, with when it ran. Timestamps are batch-level — stages were processed in waves, so the object chain (NER → NED1 → NEDg → NED2) reads in order, but predicate / elicitation batches can sit in a different wave.
| Step | Stage | Batch ID | Status | When |
|---|---|---|---|---|
| creating | Elicitation | batch_69d6aac656d48190b275efaa7d6074ee |
completed | April 8, 2026, 7:21 p.m. |
| NER | Named-entity recognition | batch_69d7e8ff7b40819089c835be710bc575 |
completed | April 9, 2026, 5:59 p.m. |
| NED1 | Entity disambiguation (via context triple) | batch_69e4ad33fdf48190a7118c7c30577ec9 |
completed | April 19, 2026, 10:23 a.m. |
| NEDg | Description generation | batch_69e4b1ee74748190a33449ce1b92813e |
completed | April 19, 2026, 10:43 a.m. |
| NED2 | Entity disambiguation (via description) | batch_69e4b3d23b18819096f3a11aecc732bd |
completed | April 19, 2026, 10:52 a.m. |
Created at: April 8, 2026, 9:30 p.m.