Triple
T11226587
| Position | Surface form | Disambiguated ID | Type / Status |
|---|---|---|---|
| Subject | IEEE 1500 embedded core test standard |
E265710
|
entity |
| Predicate | relatedTo |
P37
|
FINISHED |
| Object |
IEEE 1687 embedded instrumentation standard
IEEE 1687 embedded instrumentation standard is a test access architecture standard that defines a scalable, reconfigurable method for accessing on-chip instruments and debug features through a JTAG-based interface.
|
E912829
|
NE FINISHED |
Provenance (5 batches)
| Stage | Batch ID | Job type | Status |
|---|---|---|---|
| creating | batch_69d6aac656d48190b275efaa7d6074ee |
elicitation | completed |
| NER | batch_69d7e8ff7b40819089c835be710bc575 |
ner | completed |
| NED1 | batch_69e4ad33fdf48190a7118c7c30577ec9 |
ned_source_triple | completed |
| NED2 | batch_69e4b3d23b18819096f3a11aecc732bd |
ned_description | completed |
| NEDg | batch_69e4b1ee74748190a33449ce1b92813e |
nedg | completed |
Created at: April 8, 2026, 9:30 p.m.