IEEE 1687 embedded instrumentation standard

E912829

IEEE standard technical standard test access architecture standard

IEEE 1687 embedded instrumentation standard is a test access architecture standard that defines a scalable, reconfigurable method for accessing on-chip instruments and debug features through a JTAG-based interface.

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Statements (40)

Predicate	Object
instanceOf	IEEE standard ⓘ technical standard ⓘ test access architecture standard ⓘ
alsoKnownAs	IEEE 1687 NERFINISHED ⓘ IJTAG NERFINISHED ⓘ
appliesTo	complex integrated circuits ⓘ embedded test and measurement instruments ⓘ system-on-chip devices ⓘ
basedOn	IEEE 1149.1 NERFINISHED ⓘ
category	hardware debug standard ⓘ testability standard ⓘ
compatibleWith	IEEE 1149.1 boundary-scan architecture NERFINISHED ⓘ
concerns	instrument access procedures ⓘ instrument connectivity description ⓘ test access infrastructure ⓘ
defines	reconfigurable method for accessing on-chip instruments ⓘ scalable method for accessing on-chip instruments ⓘ test access architecture for embedded instruments ⓘ
field	design for testability ⓘ electronic design automation ⓘ integrated circuit testing ⓘ on-chip instrumentation ⓘ
goal	enable reconfigurable instrument access networks ⓘ improve scalability of test access mechanisms ⓘ provide uniform access to heterogeneous on-chip instruments ⓘ
hasAbbreviation	IJTAG NERFINISHED ⓘ
publishedBy	IEEE Standards Association NERFINISHED ⓘ Institute of Electrical and Electronics Engineers NERFINISHED ⓘ
relatedTo	IEEE 1149.1 boundary-scan standard NERFINISHED ⓘ IEEE 1500 embedded core test standard NERFINISHED ⓘ
standardNumber	IEEE Std 1687 NERFINISHED ⓘ
supports	access to embedded instruments ⓘ access to on-chip debug features ⓘ in-system test ⓘ post-silicon validation ⓘ silicon debug ⓘ
usedFor	board-level test via chip-level instruments ⓘ field diagnostics ⓘ production test ⓘ
usesInterface	JTAG-based interface ⓘ

Referenced by (1)

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IEEE 1500 embedded core test standard → relatedTo → IEEE 1687 embedded instrumentation standard ⓘ