scanning tunneling microscope
E541363
A scanning tunneling microscope is a powerful instrument that images surfaces at the atomic scale by measuring quantum tunneling currents between a sharp conductive tip and a sample.
Statements (47)
| Predicate | Object |
|---|---|
| instanceOf |
microscope
ⓘ
scientific instrument ⓘ surface analysis technique ⓘ |
| achievesResolution | atomic resolution ⓘ |
| associatedWith | IBM Zürich Research Laboratory NERFINISHED ⓘ |
| basedOn | quantum tunneling ⓘ |
| canImage |
adsorbed molecules
ⓘ
atomic-scale defects ⓘ individual atoms ⓘ |
| canMeasure |
local density of electronic states
ⓘ
surface electronic structure ⓘ work function variations ⓘ |
| enables |
construction of atomic-scale structures
ⓘ
manipulation of individual atoms ⓘ real-space imaging of surfaces ⓘ |
| hasAbbreviation | STM ⓘ |
| hasComponent |
current amplifier
ⓘ
feedback control system ⓘ piezoelectric scanner ⓘ sharp metallic tip ⓘ vibration isolation system ⓘ |
| hasMode |
constant-current mode
ⓘ
constant-height mode ⓘ spectroscopic mode ⓘ |
| inventedBy |
Gerd Binnig
NERFINISHED
ⓘ
Heinrich Rohrer NERFINISHED ⓘ |
| inventedInYear | 1981 ⓘ |
| measures | tunneling current ⓘ |
| oftenOperatedIn |
ambient conditions
ⓘ
cryogenic temperatures ⓘ ultra-high vacuum ⓘ |
| operatesBy |
maintaining constant tunneling current or constant height
ⓘ
scanning a tip over a surface ⓘ |
| recognizedBy | Nobel Prize in Physics 1986 NERFINISHED ⓘ |
| relatedTo | atomic force microscope ⓘ |
| requires |
conductive or semiconductive sample
ⓘ
conductive tip ⓘ electrical noise reduction ⓘ high mechanical stability ⓘ sub-nanometer tip–sample separation ⓘ |
| usedFor |
imaging surfaces at atomic scale
ⓘ
probing electronic properties of surfaces ⓘ studying surface structure of materials ⓘ |
| usedInField |
condensed matter physics
ⓘ
materials science ⓘ nanotechnology ⓘ surface science ⓘ |
Referenced by (2)
Full triples — surface form annotated when it differs from this entity's canonical label.