Triple

T17517253
Position Surface form Disambiguated ID Type / Status
Subject ESP-IDF E426598 entity
Predicate supportsDebuggingWith P105440 FINISHED
Object JTAG NE NERFINISHED

How this triple was built (3 steps)

Every LLM step that produced this triple, in pipeline order — named-entity classification, the disambiguation choices (the exact options shown, with the pick highlighted), and the generated description. The batch + timestamp of each is in the Provenance table below.

NER Named-entity recognition gpt-5-mini
Instruction
Given a phrase, classify it is english named entity (e.g., persons, organizations, works of art) in Latin script, or not (e.g., literals, dates, URLs, verbose phrases). For disambiguation, the statement where the phrase occurs as object is also given. Please return a JSON object with `phrase` (string, the phrase being analyzed) and `is_ne` (boolean, indicating whether the phrase is a Named Entity).
Input
Phrase: JTAG | Statement: [ESP-IDF, supportsDebuggingWith, JTAG]
NED1 Entity disambiguation (via context triple) gpt-5-mini-2025-08-07
Target entity: JTAG
Context triple: [ESP-IDF, supportsDebuggingWith, JTAG]
  • A. IEEE 1149.1 JTAG boundary‑scan standard chosen
    The IEEE 1149.1 JTAG boundary-scan standard is a widely used test and debug specification that defines a serial interface and architecture for accessing and testing the internal logic and interconnects of integrated circuits and circuit boards.
  • B. IEEE 1149.6
    IEEE 1149.6 is a boundary-scan test standard that extends JTAG to support structural testing of high-speed AC-coupled and differential digital interconnects on printed circuit boards.
  • C. IEEE 1149.4
    IEEE 1149.4 is a mixed-signal test bus standard that extends JTAG boundary-scan techniques to support testing and diagnosis of analog and mixed-signal circuits on printed circuit boards.
  • D. IEEE 1149.7
    IEEE 1149.7 is a compact, enhanced version of the JTAG test and debug standard that reduces pin count and power while adding advanced debug and trace capabilities for modern integrated circuits.
  • E. IEEE Standard for High-Speed Test Access Port and Boundary-Scan Architecture
    IEEE 1149.10 is a JTAG-related IEEE standard that defines a high-speed test access and boundary-scan architecture for efficient testing and debugging of complex digital integrated circuits and systems.
  • F. None of above.
  • G. Unsure - the case is ambiguous/there is not enough information to decide.
PD Predicate disambiguation gpt-5-mini-2025-08-07
Target predicate: supportsDebuggingWith
Context triple: [ESP-IDF, supportsDebuggingWith, JTAG]
  • A. supportsDebuggingTools chosen
    Indicates that an entity provides or is compatible with tools used for debugging or diagnosing issues.
  • B. supportsDeveloper
    Indicates that one entity provides assistance, resources, or advocacy to help a developer perform their work or achieve their goals.
  • C. supportsADB
    Indicates that one entity is capable of operating with, providing, or being compatible with Android Debug Bridge (ADB) functionality for another entity.
  • D. supportsAt
    Indicates that one entity provides assistance, endorsement, or backing to another entity in a specific context, location, or point in time.
  • E. supportsFeature
    Indicates that one entity provides, enables, or is compatible with a particular feature or capability of another.
  • F. None of above.

Provenance (3 batches)

The batch behind each pipeline step, in order, with when it ran. Timestamps are batch-level — stages were processed in waves, so the object chain (NER → NED1 → NEDg → NED2) reads in order, but predicate / elicitation batches can sit in a different wave.

Step Stage Batch ID Status When
creating Elicitation batch_69d889dd9164819087b1dc3c9240c870 completed April 10, 2026, 5:25 a.m.
NER Named-entity recognition batch_69e452615a8481909974e9855ea7a8e4 completed April 19, 2026, 3:56 a.m.
PD Predicate disambiguation batch_69e3b4f5fbcc8190a6ea9639bf5650da completed April 18, 2026, 4:44 p.m.
Created at: April 10, 2026, 5:49 a.m.