ESCA (Electron Spectroscopy for Chemical Analysis)
E681655
X-ray photoelectron spectroscopy technique
electron spectroscopy method
surface-sensitive analytical technique
ESCA (Electron Spectroscopy for Chemical Analysis) is a surface-sensitive analytical technique, also known as X-ray photoelectron spectroscopy (XPS), used to determine the elemental composition and chemical states of materials.
Observed surface forms (1)
| Surface form | Occurrences |
|---|---|
| ESCA | 0 |
Statements (50)
| Predicate | Object |
|---|---|
| instanceOf |
X-ray photoelectron spectroscopy technique
ⓘ
electron spectroscopy method ⓘ surface-sensitive analytical technique ⓘ |
| abbreviationFor | Electron Spectroscopy for Chemical Analysis NERFINISHED ⓘ |
| alsoKnownAs | X-ray photoelectron spectroscopy ⓘ |
| analysisMode |
high-resolution core-level scan
ⓘ
survey scan ⓘ |
| basedOnPhysicalEffect | photoelectric effect ⓘ |
| canDetect | all elements except hydrogen and helium ⓘ |
| canDistinguish | different chemical states of the same element ⓘ |
| canMap | lateral distribution of elements on surfaces ⓘ |
| canPerform | depth profiling with ion sputtering ⓘ |
| canQuantify | atomic concentration of elements ⓘ |
| commonlyUsedFor |
adhesion and interface studies
ⓘ
catalyst surface analysis ⓘ characterization of thin films and coatings ⓘ corrosion studies ⓘ polymer surface characterization ⓘ semiconductor device characterization ⓘ surface analysis of solids ⓘ |
| dataOutput |
intensity versus binding energy plot
ⓘ
photoelectron spectrum ⓘ |
| detects | photoelectrons emitted from a sample ⓘ |
| developedBy | Kai Siegbahn NERFINISHED ⓘ |
| developmentPeriod | 1960s ⓘ |
| energyScale | binding energy in electronvolts ⓘ |
| excitationSource |
Al Kα X-rays
ⓘ
Mg Kα X-rays ⓘ monochromatic X-ray source ⓘ |
| fullName | Electron Spectroscopy for Chemical Analysis NERFINISHED ⓘ |
| isSurfaceSensitive | true ⓘ |
| limitation |
limited sensitivity to light elements like hydrogen
ⓘ
requires vacuum-compatible samples ⓘ |
| measures |
binding energies of core-level electrons
ⓘ
chemical states of elements ⓘ elemental composition of material surfaces ⓘ |
| oftenCalibratedUsing | C 1s peak of adventitious carbon ⓘ |
| providesInformationOn |
chemical bonding environment
ⓘ
oxidation states ⓘ surface contamination ⓘ thin film composition ⓘ |
| relatedTechnique |
Auger electron spectroscopy
NERFINISHED
ⓘ
secondary ion mass spectrometry ⓘ ultraviolet photoelectron spectroscopy ⓘ |
| requires | ultra-high vacuum conditions ⓘ |
| requiresCalibrationWith | reference binding energies ⓘ |
| spatialResolution | typically tens of micrometers ⓘ |
| typicalAnalysisDepth | 1–10 nanometers ⓘ |
| typicalPressureRange | 10^-9 to 10^-7 mbar ⓘ |
| usesRadiationType | X-rays ⓘ |
Referenced by (1)
Full triples — surface form annotated when it differs from this entity's canonical label.