ESCA
E681654
ESCA (Electron Spectroscopy for Chemical Analysis) is an analytical technique based on X-ray photoelectron spectroscopy used to determine the elemental composition and chemical states of materials' surfaces.
Statements (48)
| Predicate | Object |
|---|---|
| instanceOf |
analytical technique
ⓘ
surface analysis technique ⓘ |
| abbreviationOf | Electron Spectroscopy for Chemical Analysis NERFINISHED ⓘ |
| alsoKnownAs | X-ray photoelectron spectroscopy NERFINISHED ⓘ |
| analyzes | material surfaces ⓘ |
| basedOn | photoelectric effect ⓘ |
| belongsToField |
analytical chemistry
ⓘ
materials characterization ⓘ surface science ⓘ |
| canDetect | all elements except hydrogen and helium ⓘ |
| commonlyUsedFor |
adhesion and coating studies
ⓘ
catalyst surface characterization ⓘ corrosion studies ⓘ polymer surface analysis ⓘ surface contamination analysis ⓘ thin film characterization ⓘ |
| dataOutput |
binding energy vs intensity plot
ⓘ
photoelectron spectrum ⓘ |
| determines |
chemical bonding environment
ⓘ
chemical states of elements ⓘ elemental composition of surfaces ⓘ oxidation states ⓘ |
| developedFrom | X-ray photoelectron spectroscopy principles ⓘ |
| enables |
chemical state mapping of surfaces
ⓘ
depth profiling with sputtering ⓘ |
| fullName | Electron Spectroscopy for Chemical Analysis NERFINISHED ⓘ |
| measures |
binding energy of core-level electrons
ⓘ
kinetic energy of emitted electrons ⓘ |
| provides |
chemical shift information
ⓘ
quantitative elemental analysis ⓘ surface-sensitive information ⓘ |
| quantificationMethod |
peak area analysis
ⓘ
sensitivity factor calibration ⓘ |
| relatedTo |
Auger electron spectroscopy
NERFINISHED
ⓘ
ultraviolet photoelectron spectroscopy ⓘ |
| requires |
electron energy analyzer
ⓘ
monochromatic X-ray source ⓘ ultra-high vacuum chamber ⓘ ultra-high vacuum conditions ⓘ |
| sensitivityRange | atomic percent level ⓘ |
| spectralFeatures |
Auger peaks
ⓘ
core-level peaks ⓘ plasmon loss features ⓘ shake-up satellites ⓘ |
| surfaceSensitivityReason | limited escape depth of photoelectrons ⓘ |
| typicalAnalysisDepth | a few nanometers ⓘ |
| typicalEnergyRange | 0–1500 eV binding energy ⓘ |
| usesRadiationType | X-rays ⓘ |
Referenced by (1)
Full triples — surface form annotated when it differs from this entity's canonical label.