KLA Corporation
E616389
KLA Corporation is a leading American company that provides process control and yield management systems for the semiconductor and related nanoelectronics industries.
All labels observed (1)
| Label | Occurrences |
|---|---|
| KLA Corporation canonical | 2 |
Statements (50)
| Predicate | Object |
|---|---|
| instanceOf |
public company
ⓘ
semiconductor equipment company ⓘ technology company ⓘ |
| acquired | Orbotech NERFINISHED ⓘ |
| acquisitionDate | 2019 ⓘ |
| competitor |
ASML Holding
NERFINISHED
ⓘ
Applied Materials NERFINISHED ⓘ Tokyo Electron NERFINISHED ⓘ |
| country |
United States of America
ⓘ
surface form:
United States
|
| customer |
foundries
ⓘ
integrated device manufacturers ⓘ packaging and assembly companies ⓘ semiconductor manufacturers ⓘ |
| dateOfMerger | 1997 ⓘ |
| employs | thousands of employees ⓘ |
| formerName | KLA-Tencor Corporation NERFINISHED ⓘ |
| foundedBy |
Bob Anderson
NERFINISHED
ⓘ
Kenneth Levy NERFINISHED ⓘ |
| hasR&DCenter |
Asia
NERFINISHED
ⓘ
Israel NERFINISHED ⓘ United States NERFINISHED ⓘ |
| hasSubsidiary |
Orbotech
NERFINISHED
ⓘ
SPTS Technologies NERFINISHED ⓘ |
| headquartersLocation | Milpitas, California NERFINISHED ⓘ |
| inception | 1975 ⓘ |
| industry |
inspection systems
ⓘ
metrology ⓘ process control ⓘ semiconductor equipment ⓘ yield management ⓘ |
| ISIN | US4824801009 ⓘ |
| locatedInTheAdministrativeTerritorialEntity |
California, United States
ⓘ
surface form:
California
|
| mergedWith | Tencor Instruments NERFINISHED ⓘ |
| nameChange | 2019 ⓘ |
| originallyNamed | KLA Instruments NERFINISHED ⓘ |
| productOrService |
critical dimension metrology tools
ⓘ
data analytics software ⓘ defect inspection tools ⓘ metrology systems ⓘ overlay metrology tools ⓘ process control systems ⓘ reticle inspection systems ⓘ wafer inspection systems ⓘ yield management systems ⓘ |
| servesIndustry |
nanoelectronics industry
ⓘ
semiconductor industry ⓘ |
| stockExchange | NASDAQ ⓘ |
| tickerSymbol | KLAC NERFINISHED ⓘ |
| tradedAs | NASDAQ:KLAC NERFINISHED ⓘ |
| website | https://www.kla.com ⓘ |
Referenced by (2)
Full triples — surface form annotated when it differs from this entity's canonical label.