Debye–Scherrer method

E518987

The Debye–Scherrer method is an X-ray powder diffraction technique used to determine the crystal structure and lattice parameters of polycrystalline materials.

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Predicate Object
instanceOf X-ray diffraction technique
powder diffraction method
advantage does not require single crystals
suitable for polycrystalline and powdered samples
alsoKnownAs Debye–Scherrer powder method NERFINISHED
powder camera method
analyzes intensities of diffraction rings
positions of diffraction rings
appliesTo ceramics
metals
minerals
polycrystalline materials
powdered crystalline compounds
basedOn Bragg diffraction
Bragg's law NERFINISHED
component X-ray source
collimator or slit system
cylindrical sample holder or capillary
photographic film or position-sensitive detector
developedBy Paul Scherrer NERFINISHED
Peter Debye NERFINISHED
developedIn 1916
enables determination of unit cell dimensions
identification of unknown crystalline phases
indexing of diffraction peaks
field crystallography
materials science
solid-state physics
historicalSignificance one of the earliest X-ray powder diffraction methods
measurementOutput diffraction angle 2θ
interplanar spacing d
produces diffraction rings on photographic film or detector
relatedTo Laue method NERFINISHED
Rietveld refinement
single-crystal X-ray diffraction
requires finely powdered sample
monochromatic X-ray beam
usedFor determining crystal structure of polycrystalline materials
determining lattice parameters of crystalline materials
measuring crystallite size
measuring microstrain in crystals
phase identification in polycrystalline samples
uses X-rays
powdered or polycrystalline samples
usesEquation Scherrer equation for crystallite size
usesGeometry transmission geometry
usesInstrument Debye–Scherrer camera NERFINISHED

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Peter Debye knownFor Debye–Scherrer method