Lorentz transmission electron microscopy

E1017091

Lorentz transmission electron microscopy is a specialized TEM technique used to visualize magnetic domain structures and domain walls in materials at high spatial resolution.

Try in SPARQL Jump to: Statements Referenced by

Statements (49)

Predicate Object
instanceOf electron microscopy method
magnetic imaging technique
transmission electron microscopy technique
alsoKnownAs Lorentz TEM NERFINISHED
appliedIn magnetic materials research
magnetic recording media
magnetic semiconductor research
multiferroic materials
nanomagnetism
permanent magnet development
soft magnetic materials
spintronics
thin film magnetism
basedOn Lorentz force acting on moving electrons in magnetic fields
canUse differential phase contrast in STEM mode
off-axis electron holography for quantitative phase analysis
developedWithin field of electron optics
hasAdvantage compatibility with in situ stimuli
direct real-space imaging of magnetic domains
nanometer-scale spatial resolution
hasKeyFeature high spatial resolution magnetic imaging
phase contrast due to magnetic induction
sensitivity to in-plane magnetization components
hasLimitation complex image interpretation
projection of three-dimensional magnetic structures into two dimensions
requires thin samples
measures magnetic induction integrated along electron beam path
operatesIn transmission geometry
relatedTo X-ray magnetic circular dichroism microscopy
magnetic force microscopy
spin-polarized low-energy electron microscopy
requires electron-transparent thin specimens
special imaging conditions in TEM
stable low-magnetic-field environment in the objective region
usedFor imaging magnetic vortices
imaging skyrmions
in situ heating experiments on magnetic materials
in situ magnetic field experiments
mapping magnetic microstructure in materials
studying domain wall motion
studying magnetization processes
visualization of magnetic domain structures
visualization of magnetic domain walls
uses Foucault mode imaging
Fresnel mode imaging
Lorentz lens or dedicated Lorentz mode in TEM
defocused imaging conditions
electron beam deflection by internal magnetic fields
objective lens turned off or weakly excited

Referenced by (1)

Full triples — surface form annotated when it differs from this entity's canonical label.

Néel wall canBeImagedBy Lorentz transmission electron microscopy